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Expansion of ultrathin cobalt films in (Au/Co) multilayers measured by diffraction methods

Identifieur interne : 000439 ( France/Analysis ); précédent : 000438; suivant : 000440

Expansion of ultrathin cobalt films in (Au/Co) multilayers measured by diffraction methods

Auteurs : N. Mliki [France, Tunisie] ; K. Abdelmoula [France, Tunisie] ; G. Nihoul ; C. Marlière [France] ; D. Renard

Source :

RBID : ISTEX:60CFEED256107E6FDA25363AD81D98064656CFA0

Abstract

In this paper, we present the results obtained from diffraction techniques, which give information on the structure of (00.1) h.c.p. cobalt thin films embedded in (111) f.c.c. gold layers. Electron and X-ray experiments were performed on gold-cobalt multilayers with smooth interfaces; they both show an expansion of the cobalt cell in the direction perpendicular to the interfaces; a smaller isotropic expansion in the interface plane is also shown, leading to a volume expansion and to a distortion of the cobalt cell. This expansion is found to be linked with the cobalt thickness and the nature of the spacer material.

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DOI: 10.1016/0040-6090(93)90451-T


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ISTEX:60CFEED256107E6FDA25363AD81D98064656CFA0

Le document en format XML

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   |texte=   Expansion of ultrathin cobalt films in (Au/Co) multilayers measured by diffraction methods
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